Method of validating measurement data of a process parameter fro

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36457102, G06F 1718

Patent

active

057151784

ABSTRACT:
A method for generating a validated measurement of a process parameter at a point in time by using a plurality of individual sensor inputs from a scan of said sensors at said point in time. The sensor inputs from said scan are stored and a first validation pass is initiated by computing an initial average of all stored sensor inputs. Each sensor input is deviation checked by comparing each input including a preset tolerance against the initial average input. If the first deviation check is unsatisfactory, the sensor which produced the unsatisfactory input is flagged as suspect. It is then determined whether at least two of the inputs have not been flagged as suspect and are therefore considered good inputs. If two or more inputs are good, a second validation pass is initiated by computing a second average of all the good sensor inputs, and deviation checking the good inputs by comparing each good input including a present tolerance against the second average. If the second deviation check is satisfactory, the second average is displayed as the validated measurement and the suspect sensor as flagged as bad. A validation fault occurs if at least two inputs are not considered good, or if the second deviation check is not satisfactory. In the latter situation the inputs from each of all the sensors are compared against the last validated measurement and the value from the sensor input that deviates the least from the last valid measurement is displayed.

REFERENCES:
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patent: 5005142 (1991-04-01), Lipchak et al.
patent: 5089978 (1992-02-01), Lipner et al.
patent: 5130936 (1992-07-01), Sheppard et al.
patent: 5161115 (1992-11-01), Teshima et al.

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