Method of utilizing redundancy testing to substitute for main ar

Details Method of utilizing redundancy testing to substitute for main ar Method of utilizing redundancy testing to substitute for main ar

1996-05-24

1998-03-03

Beausoliel, Jr., Robert W.

Excavating

365201, G01R 3128

Patent

active

057243654

ABSTRACT:
A method of testing Flash memory devices by performing wafer sort testing on main array cells and redundancy array cells of the Flash memory device and performing class testing on redundancy array cells only. There is a major savings of testing time with no decrease in quality of the final product.

REFERENCES:
patent: 4799021 (1989-01-01), Cozzi
patent: 4871963 (1989-10-01), Cozzi
patent: 5237535 (1993-08-01), Mielke et al.
patent: 5538141 (1996-07-01), Gross et al.
patent: 5581510 (1996-12-01), Furusho et al.

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