Image analysis – Histogram processing – For setting a threshold
Patent
1992-11-20
1994-08-30
Mancuso, Joseph
Image analysis
Histogram processing
For setting a threshold
3644131, 382 54, G06K 900
Patent
active
053435362
ABSTRACT:
A method of evaluating follicular biopsy specimens (skin samples) in order to count the number of comedones (25) present in the specimen involving the steps of applying an adhesive, in vivo, to a subject's skin; applying a microscopic slide to the adhesive covered skin; allowing the adhesive to set adhering to the slide; removing the slide with the adhesive and the skin attached thereto, thus yielding a follicular biopsy specimen; examining the specimen under a stereoscopic microscope under cross-polarized light then evaluating the specimen using image analysis hardware and software to determine the number of sebaceous plugs or comedones existing in the specimen.
REFERENCES:
patent: 4207554 (1980-06-01), Resnick et al.
patent: 4637053 (1987-01-01), Schalkowsky
patent: 4724215 (1988-02-01), Farber et al.
patent: 4741043 (1988-04-01), Bacus
patent: 4752472 (1988-06-01), Kligman
patent: 4847910 (1989-07-01), Sakuraba et al.
patent: 4856073 (1989-08-01), Farber et al.
patent: 4932044 (1990-06-01), William et al.
patent: 5107422 (1992-04-01), Kamentsky et al.
patent: 5123055 (1992-06-01), Kasdan
patent: 5163095 (1992-11-01), Kosaka
Analysis of Facial Comedos by Porphyrin Fluorescence and Image, by G. Sauermann, Ph.D., B. Ebens, Ph.D. and U. Hoppe, Ph.D.
Polarized Light Examination and Photography of the Skin, by R. Rox Anderson, M.D.
Amway Corporation
Beckman Jill M.
Mancuso Joseph
Mohr Michael A.
LandOfFree
Method of using image analysis under cross-polarized light to ev does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of using image analysis under cross-polarized light to ev, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of using image analysis under cross-polarized light to ev will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-35592