Method of using biased charging/transfer roller as in-situ...

Details Method of using biased charging/transfer roller as in-situ... Method of using biased charging/transfer roller as in-situ...

2006-12-22

2010-06-29

Ngo, Hoang (Department: 2852)

Electrophotography

Control of electrophotography process

Of plural processes

C399S026000

Reexamination Certificate

active

07747184

ABSTRACT:
The dielectric thickness of a photoreceptor is determined in a variety of ways, including using a relationship between threshold voltage and dielectric thickness, using a relationship between dielectric thickness and the difference between biased transfer roller (BTR) voltage and photoreceptor surface potential, using a relationship between dielectric thickness and biased charging roller (BCR) impedance, using a relationship between dielectric thickness and the slope of the DC current vs. voltage curve for the BTR or the BCR, and using a relationship between dielectric thickness and the BTR voltage at zero current. The threshold voltage can be found by using the slope of the BCR DC current vs. voltage curve, measuring photoreceptor surface potential for a plurality of target values below the charging knee to obtain the intercept value, or finding the actual value of the charging knee. A method of using the BCR as an electrodynamic voltmeter is also disclosed.

REFERENCES:
patent: 6611665 (2003-08-01), DiRubio et al.
patent: 6807390 (2004-10-01), Suda et al.
patent: 6917770 (2005-07-01), Bae et al.
patent: 7024125 (2006-04-01), Ishii et al.
patent: 2006/0165424 (2006-07-01), Tabb et al.
patent: 2006/0222381 (2006-10-01), Moriya et al.

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