Method of using a projection aligner for photoetching

Gas: heating and illuminating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

430 22, 430311, 355 77, G03C 500

Patent

active

049045709

ABSTRACT:
When a circuit pattern for a semiconductor device is exposed on a substrate with a coating of photoresist by using a projection aligner with positioning pads to properly position the substrate, photoresist is removed from such areas on the substrate that are expected to come in direct contact with the pads. The removing is effected before the substrate is exposed so that accumulation of photoresist on the pads can be prevented and substrates to be exposed subsequently can also be positioned accurately by using the projection aligner.

REFERENCES:
patent: 4068947 (1978-01-01), Buckley et al.
patent: 4198159 (1980-04-01), Cachon
patent: 4518678 (1985-05-01), Allen

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of using a projection aligner for photoetching does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of using a projection aligner for photoetching, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of using a projection aligner for photoetching will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-173541

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.