Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1999-02-11
1999-09-07
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356346, 385 12, G01B 902
Patent
active
059495421
ABSTRACT:
Disclosed is a tuning method for optical interference devices which comprise at least one plurality of waveguides arranged to produce a preselected phase shift in light transmitted therethrough. The tuning is carried out by irradiating the plurality of waveguides using a source of UV light. The method is faster and more reproducible than other tuning methods known in the art, such as tuning by heat induced dopant diffusion. The method is exemplified by data taken using a Mach-Zehnder interferometer. However, the method is compatible with more sophisticated devices which use integrated waveguides or large numbers of waveguides in the phase changing portion of the device.
REFERENCES:
patent: 5062684 (1991-11-01), Clayton et al.
Kohnke Glenn E.
Sparks Kevin B.
Chervenak William J.
Corning Inc.
Kim Robert H.
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