Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Patent
1997-03-17
1999-04-20
Codd, Bernard
Radiation imagery chemistry: process, composition, or product th
Including control feature responsive to a test or measurement
430296, 430396, 430 5, 430942, 2504923, G03C 500, G03F 900
Patent
active
058957367
ABSTRACT:
An electron beam lithography system radiates an electron beam uniform in beam current density through apertures formed in an aperture plate to an electron resist layer, and steps are formed in the outlet end portions of the apertures so as to decrease the beam current density of a peripheral portion of the incident electron beam, thereby preventing the electron resist layer from the proximity effect.
REFERENCES:
patent: 4393127 (1983-07-01), Greschner et al.
patent: 4855197 (1989-08-01), Zapka et al.
patent: 4957835 (1990-09-01), Aden
Codd Bernard
NEC Corporation
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