Coating apparatus – Gas or vapor deposition – With treating means
Patent
1993-03-05
1993-11-09
Bueker, Richard
Coating apparatus
Gas or vapor deposition
With treating means
118724, 219390, C23C 1600
Patent
active
052598837
ABSTRACT:
An apparatus for thermally processing semiconductor wafers within a reaction tube in which the wafers are thermally processed in a higher temperature region within the reaction tube. The thermally processed semiconductor waters are moved into a lower temperature region within the reaction tube. The rate of heat radiated from the thermally processed semiconductor waters is reduced in the lower temperature region within the reaction tube.
REFERENCES:
patent: 2145324 (1939-01-01), Stauss
patent: 3047438 (1962-07-01), Marinace
patent: 3171755 (1965-03-01), Reuschel
patent: 3314393 (1967-04-01), Haneta
patent: 3473510 (1969-10-01), Sheng
patent: 3828722 (1974-08-01), Reuter
patent: 4284867 (1981-08-01), Hill
patent: 4293590 (1981-10-01), Takagi
Semiconductor World (Monthly), Takamasa Sakai et al. (Dai Nihon Screen Man.) Jan. 1987, p. 43, New High Speed Heat Treating Furnace.
Okumura Katsuya
Yamabe Kikuo
Bueker Richard
Kabushiki Kaisha Toshiba
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