Method of testing susceptibility to failure of functional circui

Details Method of testing susceptibility to failure of functional circui Method of testing susceptibility to failure of functional circui

1999-04-30

2000-08-29

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3102

Patent

active

061114227

ABSTRACT:
A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification introduced during manufacturing of the chip are sufficient to cause failure of the functional circuitry.

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