Method of testing spacings in pattern of openings in PCB...

Details Method of testing spacings in pattern of openings in PCB... Method of testing spacings in pattern of openings in PCB...

2006-03-21

2006-03-21

Trinh, Minh (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S830000, C029S846000, C029S847000, C324S1540PB, C324S754090, C324S765010

Reexamination Certificate

active

07013563

ABSTRACT:
A method for testing opening patterns in an active area of a PCB wherein two arrays of test patterns of apertured pads are analyzed following drilling therethrough in accordance with a specified manner. Specifically, the outer patterns are first tested and if failure results in one or more of said patterns, an inner array of patterns closer to the active area are then tested and, significantly, only the respective test pattern nearest the associated array of openings is used to determine whether said array of openings meets the designated spacing criteria.

REFERENCES:
patent: 4487654 (1984-12-01), Coppin
patent: 4510446 (1985-04-01), Braun et al.
patent: 5357194 (1994-10-01), Ullman et al.
patent: 5369491 (1994-11-01), Schneider
patent: 5377404 (1995-01-01), Berg
patent: 6232559 (2001-05-01), Janecek

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