Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-09-10
1995-11-07
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324753, 345 87, G01R 3102, G09G 336
Patent
active
054650526
ABSTRACT:
Construction defects in liquid crystal display base plates are detected by placing an electro-optical element, in which the optical properties change when an electric field is applied thereto, over and facing a liquid crystal display base plate, energizing the leads of said display base plate, irradiating the base plate with a light beam through the electro-optical element, and converting the optical changes detected for each pixel element electrode into a voltage distribution. The testing method in this invention is capable of identifying not only whether or not a pixel element electrode is functional, but also if a functional pixel element electrode is functioning as desired or not. Application of the testing method of this invention is able to test liquid crystal display base plates, including those which show ambiguous display irregularities. Electro-optical elements change their optical properties when an electrical field is applied thereto.
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Karlsen Ernest F.
Photon Dynamics, Inc.
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