Method of testing interconnections in digital systems by the use

Details Method of testing interconnections in digital systems by the use Method of testing interconnections in digital systems by the use

1991-07-03

1993-04-13

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 223, G06F 1100, H04B 1700

Patent

active

052026256

ABSTRACT:
A bidirectional boundary scan circuit cell for use in boundary scan testing of device interconnections including a scan flip-flop, a first multiplexer responsive to the scan flip-flop and to a device output if the associated pin is for an output function for controllably providing as its output a replica of the scan register output or the device output, a three-state buffer responsive to the output of the first multiplexer and having its output connected to the associated device I/O pin, an input buffer whose input is connected to the associated device input/output pin and whose output comprises an input to the device if the associated I/O pin provides an input function, and a second multiplexer responsive the input buffer and a serial scan input for controllably providing as the input to the scan flip-flop a replica of the output of the input buffer or a replica of the serial scan input. For scan test purposes, the scan cell is configurable as a transmit cell for driving the associated I/O pin or as a receiver for storing the signal at the associated I/O pin.

REFERENCES:
patent: 4366393 (1982-12-01), Kasuya
patent: 5001713 (1991-03-01), Whetsel
patent: 5023875 (1991-06-01), Lee et al.
patent: 5056093 (1991-10-01), Whetsel
patent: 5115435 (1992-05-01), Langford et al.
Wagner; "Interconnect Testing with Boundary Scan"; 1987 International Test Conference; pp. 52-57.

Affiliated with

Also associated with

Rating

Method of testing interconnections in digital systems by the use does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of testing interconnections in digital systems by the use, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of testing interconnections in digital systems by the use will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1157735