Method of testing electronic circuits

Details Method of testing electronic circuits Method of testing electronic circuits

1985-03-15

1988-03-01

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 20, 371 25, G01R 3100, G01R 3128

Patent

active

047288833

ABSTRACT:
A method of testing an electronic circuit of the kind having an input port for receiving input vectors, an output port for providing output vectors, and a serial scan port for providing at least one serial scan vector reflecting the status of predetermined elements within the circuit, is performed by applying a sequence of test vectors to the input port as a plurality of sub-sequences each including at least one test vector. The serial scan vector is examined after each sub-sequence, and a determination is made as to whether a part of the serial scan vector indicates the presence of a defect in the circuit. In the event that part of the serial scan vector indicates the presence of a defect in the circuit, the corresponding part of a succeeding serial scan vector is prevented from indicating the presence of a defect.

REFERENCES:
patent: 3761695 (1973-09-01), Eichelberger
patent: 4084262 (1978-04-01), Lloyd et al.
patent: 4503536 (1985-03-01), Panzer
patent: 4534028 (1985-08-01), Trischler
patent: 4571724 (1986-02-01), Belmondo et al.
Sugamori et al., "Analysis and Definition of Overall Timing Accuracy in VLSI Test System"; 1981 IEEE Test Conference; pp. 143-153.

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