Method of testing electric circuit, and arrangement

Details Method of testing electric circuit, and arrangement Method of testing electric circuit, and arrangement

2007-04-17

2007-04-17

Vuong, Quochien B. (Department: 2618)

Telecommunications

Transmitter and receiver at separate stations

Having measuring, testing, or monitoring of system or part

C455S424000

Reexamination Certificate

active

10675414

ABSTRACT:
A method of testing an electric circuit and an arrangement for implementing the method are provided. The arrangement includes a current source connected to a network of electric components, the current source for supplying current to at least one current path of the network, the network being characterized with a predefined network configuration; a measurement unit connected to the network, the measurement unit for measuring effective values of node voltages in at least two nodes of the at least one current path, a node representing an equipotential point of adjacent electric components; and a processing unit connected to the measurement unit, the processing unit for deriving a characterizing value of at least one electric component of the network by using the effective value of current, the effective values of the node voltages, and the predefined network configuration.

REFERENCES:
patent: 4611101 (1986-09-01), Walter et al.
patent: 5416409 (1995-05-01), Hunter
patent: 5610530 (1997-03-01), Whetsel
patent: 5887001 (1999-03-01), Russell
patent: 5968191 (1999-10-01), Thatcher et al.
patent: 6021315 (2000-02-01), Telewski
patent: 100829 (1993-04-01), None
IEEE Std 1149.1-2001, “IEEE Standard Test Access Port and Boundary-Scan Architecture”. Jun. 14, 2001.
IEEE Std 1149.4-2001, “IEEE Standard for a Mixed-Signal Test Bus”, Jun. 26, 2001.

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