Method of testing devices to be measured and testing system ther

Details Method of testing devices to be measured and testing system ther Method of testing devices to be measured and testing system ther

1994-07-01

1996-07-16

Teska, Kevin J.

Boots, shoes, and leggings

364488, 364490, 324 731, G01R 313183

Patent

active

055373313

ABSTRACT:
Disclosed is a method of sequentially conducting a series of tests on devices to be measured starting with a first test up to an Nth test. The method comprises the step of conducting the tests on the plurality of devices to be measured concurrently in sequence starting with the first test. During that time, determination as to whether each of the devices to be measured is defective or non-defective is made each time the test is completed. If it is determined that any of the devices to be measured is defective after any of the series of tests is completed, that defective device alone is replaced with a new device to be measured, and the series of tests are restarted starting with a test subsequent to the test in which the defective device is generated.

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"Testing VLSI Chips with Weighted Random Patterns", by J. Waicukauski and F. Motika, IEEE VLSI Technology, Systems and Applications Symposium, 1989, pp. 149-154.
"High Precision Testing Method of Mixed Signal Device", by A. Watanabe et al., IEEE Advanced Technologies in I & M, 1994, pp. 1284-1288.

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