Method of testing continuity of a connection between an integrat

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324527, 324750, 324754, G01R 3102

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active

053999754

ABSTRACT:
A method of testing the electrical conductivity of a connection between an integrated circuit device (9) and a circuit board (7) to which the device (9) is connected. The device (9) includes a current path between a further connection (13) thereto and the connection (15) to be tested. The method comprises the steps of, while the circuit is inoperative: applying via the board (8) a potential of a first amount to the further connection (13); applying via the board (7) a potential of a second different amount to the connection (15) being tested; and positioning a probe adjacent the device (9) to sense indirectly current in the current path, the presence of current indicating that the connection (15) being tested is conductive.

REFERENCES:
patent: 3992663 (1976-11-01), Seddick
patent: 4186338 (1980-01-01), Fichtenbaum
patent: 4220917 (1980-09-01), McMahon, Jr.
patent: 4727317 (1988-02-01), Oliver
patent: 4779043 (1988-10-01), Williamson, Jr.
patent: 4963824 (1990-10-01), Hsieh et al.
patent: 5059897 (1991-10-01), Aton et al.

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