Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1993-10-15
1995-05-16
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356360, G01B 902
Patent
active
054165865
ABSTRACT:
A Fizeau interferometer (10) producing spherical test and reference wavefronts (34 and 36) is operated with a linear translator (50) for making a sequence of subaperture measurements of an aspherical test surface (40). Separate phase maps (88 and 90) are assembled at different focus positions (54 and 56) along a common optical axis (52) of the interferometer (10) and aspherical test surface (40). Respective null zones (92 and 94) are isolated from the phase maps (88 and 90) and are combined to form a composite phase map (100) defining differences between the aspherical test surface (40) and a family of spheres.
REFERENCES:
patent: 4743117 (1988-05-01), Kitabayashi et al.
patent: 4872755 (1989-10-01), Kuchel
patent: 5004346 (1991-04-01), Kuhel
"Subaperture Testing of Aspheres with Annular Zones" by Ying-Moh Liu, George N. Lawrence and Christ L. Koliopoulos, Optical Sciences Center, University of Arizona, Tucson, Ariz., 37 pages, Jan. 1988.
"Method for subaperture testing interferogram reduction" by Weng W. Chow and George N. Lawrence, Optics Letters, vol. 8, No. 9, Optical Society of America, Sep. 1983, pp. 468-470.
Bruning John H.
Fleig Jon F.
Huang Chunsheng
Tronolone Mark J.
Tropel Corporation
Turner Samuel A.
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