Method of testing and repairing magnetic bubble domain chip

Details Method of testing and repairing magnetic bubble domain chip Method of testing and repairing magnetic bubble domain chip

1975-06-30

1977-01-04

Corcoran, Robert J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

340174TF, 340174TC, G01R 3312

Patent

active

040016730

ABSTRACT:
A method of both testing all loops of a long serial magnetic bubble domain chip, and repairing the chip for automatic bypass of defective loops. Each repair station associated with each loop is sequentially loaded with a bubble domain. Then new domains are sequentially generated and positioned adjacent each loop. The domains initially loaded into the repair stations are shifted out in parallel for propagation along the loops. The new domains are then loaded in parallel into the repair stations. The domains propagated along the loops are read to determine defective loops, and form a basis for generating a repair pattern. The repair pattern is then loaded in parallel into the repair stations for sealing off defective loops.

REFERENCES:
patent: 3792450 (1974-02-01), Bogar et al.
patent: 3921156 (1975-11-01), Yoshimi

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