Method of testing and predicting failures of electronic mechanic

Details Method of testing and predicting failures of electronic mechanic Method of testing and predicting failures of electronic mechanic

1994-10-17

1996-12-03

Beausoliel, Jr., Robert W.

395 62, G06F 1134

Patent

active

055816940

ABSTRACT:
A method employing a knowledge base of human expertise comprising a reliability model analysis implemented for diagnostic routines is disclosed. The reliability analysis comprises digraph models that determine target events created by hardware failures human actions, and other factors affecting the system operation. The reliability analysis contains a wealth of human expertise information that is used to build automatic diagnostic routines and which provides a knowledge base that can be used to solve other artificial intelligence problems.

REFERENCES:
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patent: 4967337 (1990-10-01), English et al.
patent: 5127005 (1992-06-01), Oda et al.
patent: 5272704 (1993-12-01), Tong et al.
patent: 5297150 (1994-03-01), Clark
patent: 5418889 (1995-05-01), Ito

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