Method of testing an integrated circuit within an automated hand

Details Method of testing an integrated circuit within an automated hand Method of testing an integrated circuit within an automated hand

1995-06-01

1998-03-31

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, G01R 102

Patent

active

057342709

ABSTRACT:
A method for testing of an integrated circuit of a semiconductor device which is packaged in a housing with leads projecting from the housing and contact elements, other than leads, disposed along one or more of the surfaces of the housing is disclosed. A plurality of decoupling capacitors are mounted on a printed circuit board and disposed for being temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station, wherein a test environment is created which closely approximates a real operating environment of the integrated circuit.

REFERENCES:
patent: 5109596 (1992-05-01), Driller et al.

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