Method of testing an electrical circuit

Details Method of testing an electrical circuit Method of testing an electrical circuit

1974-03-28

1976-01-20

Kominski, John

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324 96, 324158D, 350160LC, G01R 3122

Patent

active

039341992

ABSTRACT:
A non-destructive method of testing an electrical circuit includes observing birefringent changes in a layer of liquid crystals during the operation of the circuit. The method comprises applying the layer of liquid crystals over the circuit with the liquid crystal molecules oriented in the same direction. A beam of light is directed through the layer of liquid crystals with an optical system adapted to make the birefringent changes visible. The circuit is energized with either an ac or a dc voltage, and the birefringent changes produced by the electric fields, and/or the currents, and/or the temperature distributions in the layer of liquid crystals are observed so that a comparison can be made between the observed birefringent changes and birefringent changes produced by a normally operating circuit.

REFERENCES:
"Spotting IC Pin Holes with Liquid Crystals"; Electronics; Feb. 28, 1972; pp. 6E, 7E.

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