Method of testing an analog-to-digital converter

Details Method of testing an analog-to-digital converter Method of testing an analog-to-digital converter

1996-10-04

1998-12-29

Young, Brian K.

Coded data generation or conversion

Converter calibration or testing

341155, H03M 112

Patent

active

058545980

ABSTRACT:
Only the value of the least-significant bit, or of some of the less-significant bits is used in order to test an analog-to-digital converter in an integrated circuit. The information concerning the differential and the integral non-linearity can be determined from the values of said less-significant bit. Furthermore, the functionality of the analog-to-digital converter is tested by counting the number of changes of the least-significant bit and by comparing this number with the value formed by the other bits.

REFERENCES:
patent: 5132685 (1992-07-01), De Witt et al.
"Integrated Analog-to-Digital and Digital-to-Analog Converters", by Rudy van de Plassche, Kluwer Academic Publishers, ISBN 0-7923-9436-4, pp. 87-88 .

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