Method of testing a semiconductor device having a first circuit

Details Method of testing a semiconductor device having a first circuit Method of testing a semiconductor device having a first circuit

1993-02-12

1995-01-10

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324769, 437 8, G01R 104

Patent

active

053811054

ABSTRACT:
Testing of a semiconductor device (10, 30) is facilitated by forming the semiconductor device (10, 30) to have a first portion (17) that is electrically isolated from a second portion (19, 27). Testing is first performed on the first portion (17) of the semiconductor device (10, 30). After the testing is complete, the first portion (17) of the semiconductor device (10, 30) is electrically coupled to the second portion (19, 27) of the semiconductor device (10, 30) .

REFERENCES:
patent: 3870953 (1975-03-01), Boatman et al.
patent: 4823088 (1989-04-01), Fukada
patent: 4876584 (1989-10-01), Taylor
patent: 5034845 (1991-07-01), Murakami

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