Method of testing a memory by scanning at increasing time interv

Details Method of testing a memory by scanning at increasing time interv Method of testing a memory by scanning at increasing time interv

1980-08-26

1983-12-27

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

324210, 365201, 371 21, G01R 3312, G01R 1512

Patent

active

044233809

ABSTRACT:
The disclosure is of a method and system for scanning all of the cells of a dynamic memory at selected increasing time intervals. The apparatus includes first and second counters coupled to a comparator, the output of which triggers the operation of the scanning apparatus.
When the system is turned on, the count in both counters is the same, and a signal appears at the output of the comparator to trigger the scanner. If no error appears in the memory, the first counter is incremented by a selected first count, and then the second counter is incremented from zero until its count equals that in the first counter, and, again, an output from the comparator triggers the scanner. Again, if no error appears in the memory, the first counter is incremented by a second greater count, which represents a larger time interval, and the second counter is incremented from zero until its count equals that entered in the first counter, and the comparator again energizes the scanner. This operation is repeated with progressively higher counts in the first counter, representing larger and larger time intervals, until an error appears in the memory.

REFERENCES:
patent: 3870963 (1975-03-01), Groce et al.
Anolick et al., "Memory Test System", Dec. 1979, IBM Tech. Disclosure Bulletin, vol. 22, No. 7, pp. 2837-2838.

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