Method of testing a magnetic head for eliminating defective...

Details Method of testing a magnetic head for eliminating defective... Method of testing a magnetic head for eliminating defective...

2006-09-06

2008-08-26

Patidar, Jay M (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

Reexamination Certificate

active

07417423

ABSTRACT:
The method of testing a magnetic head is capable of purely evaluating characteristics of the magnetic head without influences caused by external factors. The method of testing a magnetic head comprises the steps of: detecting amount of noises, which are included in output signals of a reading element of the magnetic head, a plurality of times in a state of reading no magnetic data; and comparing an amount of variation between the detected amounts of noises with a threshold value.

REFERENCES:
patent: 5134366 (1992-07-01), Kirk
patent: 5668477 (1997-09-01), Mahmoudian et al.
patent: 5854554 (1998-12-01), Tomita et al.
patent: 6538430 (2003-03-01), Carrington et al.
patent: 6738208 (2004-05-01), Dakroub
patent: 7248039 (2007-07-01), Green et al.
patent: 2004-127511 (2004-04-01), None

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