Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-08-31
2009-12-08
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07630855
ABSTRACT:
A method of diagnosing a temperature sensing system having a temperature sensor, a field processing module coupled to the temperature sensor, a bitbus, a fieldbus, and an auxiliary processing module communicating with the bitbus and the fieldbus. The method includes generating a temperature characteristic at the temperature sensor, processing the temperature characteristic at the field processing module, and generating field operating data including a temperature diagnostic parameter as a function of the temperature characteristic. The method also includes communicating the field operating data including the temperature diagnostic parameter over the bitbus from the field processing module to the auxiliary processing module, generating at the auxiliary processing module auxiliary field data as a function of the received field operating data, and communicating the auxiliary field data over the fieldbus.
REFERENCES:
patent: 5642301 (1997-06-01), Warrior et al.
patent: 5746511 (1998-05-01), Eryurek et al.
patent: 5754596 (1998-05-01), Bischoff et al.
patent: 5764891 (1998-06-01), Warrior
patent: 5828567 (1998-10-01), Eryurek et al.
patent: 5828851 (1998-10-01), Nixon et al.
patent: 5862052 (1999-01-01), Nixon et al.
patent: 5909368 (1999-06-01), Nixon et al.
patent: 5960214 (1999-09-01), Sharpe, Jr. et al.
patent: 5960375 (1999-09-01), Warrior et al.
patent: 5970430 (1999-10-01), Burns et al.
patent: 5978578 (1999-11-01), Azarya et al.
patent: 5995916 (1999-11-01), Nixon et al.
patent: 6026352 (2000-02-01), Burns et al.
patent: 6151640 (2000-11-01), Buda et al.
patent: 6195591 (2001-02-01), Nixon et al.
patent: 6266726 (2001-07-01), Nixon et al.
patent: 6298454 (2001-10-01), Schleiss et al.
patent: 6304934 (2001-10-01), Pimenta et al.
patent: 6356191 (2002-03-01), Kirkpatrick et al.
patent: 6377859 (2002-04-01), Brown et al.
patent: 6397114 (2002-05-01), Eryurek et al.
patent: 6405139 (2002-06-01), Kicinski et al.
patent: 6434504 (2002-08-01), Eryurek et al.
patent: 6446202 (2002-09-01), Krivoshein et al.
patent: 6449574 (2002-09-01), Eryurek et al.
patent: 6449715 (2002-09-01), Krivoshein
patent: 6473710 (2002-10-01), Eryurek
patent: 6510352 (2003-01-01), Badavas et al.
patent: 6510397 (2003-01-01), Choe
patent: 6519546 (2003-02-01), Eryurek et al.
patent: 6532392 (2003-03-01), Eryurek et al.
patent: 6539267 (2003-03-01), Eryurek et al.
patent: 6556145 (2003-04-01), Kirkpatrick et al.
patent: 6557118 (2003-04-01), Schleiss et al.
patent: 6567709 (2003-05-01), Malm et al.
patent: 6594603 (2003-07-01), Eryurek et al.
patent: 6615090 (2003-09-01), Blevins et al.
patent: 6711446 (2004-03-01), Kirkpatrick et al.
patent: 6754601 (2004-06-01), Eryurek et al.
patent: 6816810 (2004-11-01), Henry et al.
patent: 6907331 (2005-06-01), Paquet
patent: 7058542 (2006-06-01), Hauhia et al.
patent: 7173909 (2007-02-01), Deuter et al.
patent: 7337369 (2008-02-01), Barthel et al.
patent: 7370239 (2008-05-01), Apel et al.
patent: 7392165 (2008-06-01), Nixon et al.
patent: 2002/0022991 (2002-02-01), Sharood et al.
patent: 2002/0147511 (2002-10-01), Eryurek et al.
patent: 2002/0154603 (2002-10-01), Deuter et al.
patent: 2002/0194547 (2002-12-01), Christensen et al.
patent: 2003/0046382 (2003-03-01), Nick
patent: 2005/0004726 (2005-01-01), Paquet
patent: 2005/0137735 (2005-06-01), Loy et al.
patent: 2007/0010968 (2007-01-01), Longsdorf et al.
patent: 10220390 (2002-12-01), None
patent: WO 2004099889 (2004-11-01), None
Horowitz and Hill, The Art of Electronics, Cambridge University Press, 1989, pp. 988-993.
http://web.archive.org/web/20040605004027/www.eng.ox.ac.uk/World/Research/Summary/B-Invensys.html, Ivensys University Technology Centre for Advanced Instrumentation, Research Summary, Department of Engineering Science, University of Oxford, pp. 1-8, Oct. 14, 2003.
http://web.archive.org/web/20030425143231/http://fieldbus.org/About/FoundationTech/AboutFoundationTech/SupportsInteroperability, Fieldbus Foundation, About Foundation Technology, p. 1, Aug. 30, 2005.
http://web.archive.org/web/20040517042225/fieldbus.org/About/FoundationTech/AboutFoundationTech/cont—body.asp, Fieldbus Foundation, Supports Interoperatbility, p. 1-3, Apr. 25, 2003.
http://web.archive.org/web/20040517042236/fieldbus.org/About/FoundationTech/cont—body.asp, Fieldbus Foundation, What is Fieldbus, p. 1, Aug. 30, 2005.
Clausen M. et al., “Cryogenic controls for the TESLA test facility”, Dec. 15, 1994.
Chemane L. A. et al., “Industrial Information Infrastructure and Intelligent Instrumentation-The Options”, Jul. 7, 1997.
Marino P. et al., “Using LOTOS in the specification of industrial bus communication protocols”, Aug. 21, 2004.
International Search Report and Written Opinion for PCT/US2005/031289.
U.S. Patent and Trademark Office Action for U.S. Appl. No. 11/216,380, Dated Jan. 11, 2008, pp. 1-26.
U.S. Patent and Trademark Office Action for U.S. Appl. No. 11/216,378, Dated Oct. 12, 2006, pp. 1-21.
U.S. Patent and Trademark Office Action for U.S. Appl. No. 11/216,379, Dated Jan. 9, 2008, pp. 1-31.
U.S. Patent and Trademark Office Action for U.S. Appl. No. 11/216,380, Dated Oct. 15, 2008.
U.S. Patent and Trademark Office Notice of Allowance for U.S. Appl. No. 11/216,378, Dated Oct. 6, 2008.
Notice of Allowance for U.S. Appl. No. 11/216,380, EntitledDistributed Diagnostic Operations System,Dated Dec. 22, 2008.
United States Patent and Trademark Office Action for U.S. Appl. No. 11/216,379 dated Mar. 6, 2009.
European Office Action Dated Apr. 4, 2009.
Notice of Allowance for U.S. Appl. No. 11/216,379, Dated Jul. 15, 2009.
Culbertson David P.
Fennewald Kenneth F.
Lenz Gary A.
McNutt Leon J.
Schuh William C.
Brinks Hofer Gilson & Lione
Cherry Stephen J
Dunn Drew A
Watlow Electric Manufacturing Company
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