Optics: measuring and testing – Material strain analysis – With polarized light
Patent
1989-09-15
1991-07-02
Willis, Davis L.
Optics: measuring and testing
Material strain analysis
With polarized light
G01L 124
Patent
active
050281305
ABSTRACT:
A method of stress-optical force measurement where a linearly polarized light ray is guided into a stress-optical measurement array consisting of several measurement members on which the force to be measured acts in a distributed manner. The light ray successively traverses the measurement members while being influenced in a force-dependent manner and is applied to a subsequent evaluation unit for evaluation. The invention also relates to a measurement device for performing the method, comprising a measurement array and an evaluation unit between two plates which are arranged in parallel at a distance from one another. The measurement array consists of at least three spaced stress-optical measurement members which keep the plates at a distance from one another, influence the light ray in a force-dependent manner, and guide the light ray into the evaluation unit arranged between two measurement members.
REFERENCES:
patent: 4668085 (1987-05-01), Pitt et al.
Hoffmann Hans J. H. G.
Martens Gerhard
Koren Matthew W.
U.S. Philips Corporation
Wieghaus Brian J.
Willis Davis L.
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