Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Low workfunction layer for electron emission
Reexamination Certificate
2005-11-29
2005-11-29
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Low workfunction layer for electron emission
C257S010000, C257S016000
Reexamination Certificate
active
06969868
ABSTRACT:
Alloy memory structures and methods are disclosed wherein a layer or volume of alloy material changes conductivity subsequent to introduction of a electron beam current-induced change in phase of the alloy, the conductivity change being detected using current detection means such as photon-emitting P-N junctions, and being associated with a change in data bit memory state.
REFERENCES:
patent: 4817053 (1989-03-01), Ikeda et al.
patent: 4876667 (1989-10-01), Ross et al.
patent: 5471040 (1995-11-01), May
patent: 6087674 (2000-07-01), Ovshinsky et al.
patent: 6636477 (2003-10-01), Miyamoto et al.
patent: 6707087 (2004-03-01), Fricke et al.
Brown Michael A.
Hannah Eric C.
Chen George
Intel Corporation
Nelms David
Nguyen Thinh T
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