Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal
Reexamination Certificate
2005-07-29
2008-12-02
Vu, David (Department: 2818)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
C438S022000, C438S029000, C438S048000
Reexamination Certificate
active
07459321
ABSTRACT:
Alloy memory structures and methods are disclosed wherein a layer or volume of alloy material changes conductivity subsequent to introduction of a electron beam current-induced change in phase of the alloy, the conductivity change being detected using current detection means such as photon-emitting P-N junctions, and being associated with a change in data bit memory state.
REFERENCES:
patent: 4817053 (1989-03-01), Ikeda et al.
patent: 4876667 (1989-10-01), Ross et al.
patent: 5471040 (1995-11-01), May
patent: 6087674 (2000-07-01), Ovshinsky et al.
patent: 6636477 (2003-10-01), Miyamoto et al.
patent: 6707087 (2004-03-01), Fricke et al.
patent: 2003/0206512 (2003-11-01), Ashton
Brown Michael A.
Hannah Eric C.
Chen George
Intel Corporation
Nguyen Thinh T
Vu David
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