Method of stabilizing semiconductor device by converting doped p

Metal treatment – Compositions – Heat treating

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148186, 148187, 357 23, 357 59, H01L 2126

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041793110

ABSTRACT:
A method for making a semiconductor device is described in which polycrystalline silicon is vacuum deposited and then converted to silicon dioxide thereby providing a number of advantages over direct deposition of silicon dioxide. The method has particular applicability to isoplanar MOSFET integrated circuit manufacturing.

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Nomura et al., ". . Oxidation of Si . . . ", Ion Implantation in Semiconductor, Ed. Namba, Plenum, 1974, N.Y., p. 681.
Fritzsches et al. ". . . Oxid. of Si after Ion Impl. 11, J. Electrochem. Soc. 20 (1973), 1603.

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