Optics: measuring and testing – Miscellaneous
Patent
1994-07-06
1995-08-29
Evans, F. L.
Optics: measuring and testing
Miscellaneous
G01N 2188
Patent
active
054465370
ABSTRACT:
It is an object to provide a method of sorting semiconductor lasers, capable of appropriately removing semiconductor lasers which can cause a so-called sudden death in use. After a first current within a range of 50 to 150% the maximum rated current is supplied to the semiconductor lasers for a predetermined period of time, a second current is supplied within a range of 120 to 250% the maximum rated current for a short period of time. Semiconductor lasers which are destroyed or degraded in output characteristics are removed as defective devices.
REFERENCES:
patent: 5116767 (1992-05-01), De Chiaro et al.
Patent Abstracts of Japan, Abstract of 60-198793, Oct. 8, 1985, ABS GRP No: E382, No. 42, vol. 10.
Hashimoto Jun-Ichi
Katsuyama Tsukuru
Yoshida Ichiro
Evans F. L.
Sumitomo Electric Industries Ltd.
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