Method of sorting a group of integrated circuit devices for thos

Details Method of sorting a group of integrated circuit devices for thos Method of sorting a group of integrated circuit devices for thos

1997-02-17

1998-12-01

Elmore, Reba I.

Boots, shoes, and leggings

36446801, 36446802, 36446815, 36446816, G06F 1900, G06G 76466

Patent

active

058448039

ABSTRACT:
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data in association with the fuse ID of each of the devices indicating each of the devices requires either enhanced reliability testing or standard testing. The fuse ID of each of the devices is then automatically read before, during, or after standard testing of the devices. The testing process requirement data stored in association with the fuse ID of each of the devices is then accessed, and the devices are sorted in accordance with the accessed data into those devices requiring enhanced reliability testing and those requiring standard testing. The method thus directs those devices needing enhanced reliability testing to such testing without the need for all devices from the same wafer or wafer lot to proceed through special testing.

REFERENCES:
patent: 4958373 (1990-09-01), Usami et al.
patent: 4967381 (1990-10-01), Lane et al.
patent: 5103166 (1992-04-01), Joen et al.
patent: 5105362 (1992-04-01), Kotani
patent: 5217834 (1993-06-01), Higaki
patent: 5219765 (1993-06-01), Yoshida et al.
patent: 5226118 (1993-07-01), Baker et al.
patent: 5271796 (1993-12-01), Miyashita et al.
patent: 5289113 (1994-02-01), Meaney et al.
patent: 5294812 (1994-03-01), Hashimoto et al.
patent: 5301143 (1994-04-01), Ohri et al.
patent: 5420796 (1995-05-01), Weling et al.
patent: 5440493 (1995-08-01), Doida
patent: 5442561 (1995-08-01), Yoshizawa et al.
patent: 5450326 (1995-09-01), Black
patent: 5467304 (1995-11-01), Uchida et al.
patent: 5483175 (1996-01-01), Ahmad et al.
patent: 5495417 (1996-02-01), Fuduka et al.
patent: 5504369 (1996-04-01), Dasse et al.
patent: 5511005 (1996-04-01), Abbe et al.
patent: 5568408 (1996-10-01), Maeda

Affiliated with

Also associated with

Rating

Method of sorting a group of integrated circuit devices for thos does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of sorting a group of integrated circuit devices for thos, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of sorting a group of integrated circuit devices for thos will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2400560