Method of simulating semiconductor integrated circuit

Details Method of simulating semiconductor integrated circuit Method of simulating semiconductor integrated circuit

2005-12-29

2009-06-09

Rodriguez, Paul L (Department: 2123)

Data processing: structural design, modeling, simulation, and em

Simulating electronic device or electrical system

Circuit simulation

C703S018000, C716S030000, C716S030000, C324S765010

Reexamination Certificate

active

07546231

ABSTRACT:
A method and computer program for simulating a semiconductor integrated circuit is disclosed, in which a voltage coefficient of resistance according to a variation of width or length of a resistor device of the integrated circuit may be accurately applied to a model in a manner of including the length and width in variables for measuring the resistance of the resistor device and by which efficiency of a circuit design is considerably enhanced. The method generally includes the steps of measuring a plurality of resistances of a plurality resistors having different length (L) and width (W) from each other while varying a voltage applied to the resistors respectively, calculating a voltage coefficient resist (VCR) of the resistors using the measured resistances, the VCR expressed as a linear function of voltage, and calculating resistance of a certain resistor device having a specific length and width using the VCR. The computer program is generally configured to calculate a voltage coefficient of resistance (VCR) of the resistor as a function of voltage (dV), length (L) and width (W).

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Kenji Oohata, Hiroshi Shimomura and Kyoko Hirata; “Apparatus and Method for Automatically Determining Device Size”; Patent Publication No. 2004-062346; Publication Date: Feb. 26, 2004; Patent Abstracts of Japan; Japan.

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