Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-06-14
2011-06-14
Bali, Vikkram (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S141000
Reexamination Certificate
active
07961933
ABSTRACT:
Reference data for automatically inspecting shapes of fillets formed on a substrate are set to an inspection device that illuminates the substrate from specified directions to generate an image. For each type of components mounted to the substrate, a database is prepared, registering sets of reference data corresponding to different fillet shapes in correlation with heights of solder for forming fillets having these shapes. After components to be an object of inspection are identified, specified steps are carried out on each of these components, including the step of obtaining data on the height of solder for forming the fillet related to a land for which a target area for inspection has been set and reading out reference data corresponding to the data obtained from the reference data registered in the database.
REFERENCES:
patent: 2004/0101190 (2004-05-01), Maida et al.
patent: 2005/0196996 (2005-09-01), Yamasaki et al.
patent: 63-112054 (1989-11-01), None
patent: 10-118641 (1999-11-01), None
patent: 2002-228181 (2004-03-01), None
Doi Yasutomo
Fujii Yoshiki
Moriya Toshihiro
Nakajima Akira
Nakajima Yasuaki
Bajwa Haris
Bali Vikkram
Omron Corporation
Weaver Austin Villeneuve & Sampson LLP
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