Image analysis – Histogram processing – For setting a threshold
Patent
1980-06-16
1983-10-11
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
364491, 2504921, G06F 1546, G06K 900
Patent
active
044096860
ABSTRACT:
The dice of a wafer are serialized using a wafer mask formed by stepping and repeating a chip pattern with a blank area in rows and columns on the wafer and forming distinctive location identifying indicia in the blank area on each chip using a pattern generator and stepping to each blank area on each chip.
REFERENCES:
patent: 3673932 (1972-07-01), Rottmiller
patent: 3838435 (1974-09-01), Mepham et al.
patent: 4011570 (1977-03-01), Stievenart et al.
patent: 4040723 (1977-08-01), Groeneweg
patent: 4093990 (1978-06-01), Koller et al.
patent: 4259724 (1981-03-01), Sugiyama
Davis et al., "Automatic Registration in an Electron-Beam Lithographic System", Solid State Technology, Aug. 1978, pp. 61-67.
Harlow Justin E.
Ports Kenneth A.
Boudreau Leo H.
Harris Corporation
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