Method of screening defects using low voltage IDDQ measurement

Details Method of screening defects using low voltage IDDQ measurement Method of screening defects using low voltage IDDQ measurement

2005-10-11

2005-10-11

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S076690

Reexamination Certificate

active

06954705

ABSTRACT:
A method of screening defects includes steps of: (a) measuring a quiescent current at a first supply voltage for each of a plurality of devices; (b) measuring a quiescent current at a second supply voltage for each of the plurality of devices; (c) generating a plot of the quiescent current measured at the first supply voltage vs. the quiescent current measured at the second supply voltage for each of the plurality of devices; (d) determining a range of intrinsic variation of quiescent current in the plot; and (e) identifying any of the plurality of devices corresponding to a measurement plotted outside the range of intrinsic variation as defective.

REFERENCES:
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 6031386 (2000-02-01), Cole et al.

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