Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2004-11-04
2010-06-29
Bhat, Aditya (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
Reexamination Certificate
active
07747408
ABSTRACT:
A method of scanning is disclosed comprising, providing a scanning system (10) having a sample holder (14) and a relatively movable scanning device (18), performing a scan of at least a part of an object (22) located on the sample holder (14), establishing orientation of the sample holder and interpreting data from a scan using the orientation whereby, the orientation is established using data from the scan of the surface of the sample holder. The orientation may be established by defining a plane (56b) of the sample holder, which may be limited by boundaries (76a,76b).
REFERENCES:
patent: 5391871 (1995-02-01), Matsuda et al.
patent: 5440496 (1995-08-01), Andersson et al.
patent: 6327788 (2001-12-01), Seddon et al.
patent: 6697096 (2004-02-01), Agorio
patent: 7436522 (2008-10-01), Steinbichler et al.
patent: 2005/0060868 (2005-03-01), McMurtry
patent: 2006/0037208 (2006-02-01), McMurtry
patent: 0 517 270 (1992-12-01), None
patent: A-02-147803 (1990-06-01), None
patent: WO 03/046412 (2003-06-01), None
patent: WO 2004/020939 (2004-03-01), None
Bhat Aditya
Oliff & Berridg,e PLC
Renishaw PLC
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