Method of rinsing and drying semiconductor wafers in a chamber w

Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...

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134 2, 134 21, 134 254, 134 255, 134 26, 134 31, 134183, 134902, 34 77, 34 78, B08B 300

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active

059139811

ABSTRACT:
A method and apparatus for rinsing and drying semiconductor wafers. The apparatus includes side walls, end walls and a base. At least a portion of the wall descends relative to the base to facilitate the flow of liquid from the chamber. One embodiment of the apparatus includes a rigid side and end walls. In another embodiment of the apparatus, at least a portion of the side wall is collapsible. In yet another embodiment of the apparatus, at least a portion of the wall has a tambour configuration, facilitating bending or rolling of the wall beneath the base. The apparatus includes an assembly for injecting a rinse liquid into the chamber. The apparatus also includes an assembly for injecting a drying fluid into the chamber. The method includes placing a semiconductor wafer into the rinse/dry apparatus, directing rinse liquid over the semiconductor wafer, and lowering a side wall of the rinse/dry apparatus to remove rinse liquid therefrom.

REFERENCES:
patent: 5022419 (1991-06-01), Thompson et al.
patent: 5115576 (1992-05-01), Roberson, Jr. et al.
patent: 5190064 (1993-03-01), Aigo
patent: 5474616 (1995-12-01), Hayami et al.
patent: 5520744 (1996-05-01), Fujikawa et al.
patent: 5524361 (1996-06-01), Dexter et al.
patent: 5571337 (1996-11-01), Mohindra et al.
patent: 5634978 (1997-06-01), Mohindra et al.
patent: 5635053 (1997-06-01), Aoki et al.
patent: 5653045 (1997-08-01), Ferrell
patent: 5656097 (1997-08-01), Olesen et al.
patent: 5743280 (1998-04-01), Han

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