Method of resonance spectroscopy for the analysis of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C702S075000, C702S077000, C324S300000, C436S173000

Reexamination Certificate

active

07076383

ABSTRACT:
The invention refers to a method of resonance spectroscopy for the analysis of statistical properties of samples, comprising the following steps: a) recording of a complex resonance frequency spectrum of each sample by means of phase sensitive quadrature detection; b) numerical differentiation of the recorded complex resonance frequency spectra versus frequency; c) determination of the absolute value of each differentiated complex resonance frequency spectrum (=fingerprint); d) allocation of each fingerprint to a point of a multidimensional point set; and e) performing a pattern analysis of the generated points for characterizing the statistical properties of the samples. The inventive method tolerates unintended variances of measurement in the recorded resonance frequency spectra, in particular caused by phase errors, and allows reliable automated spectral analysis.

REFERENCES:
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patent: 5838156 (1998-11-01), Miyabayashi
patent: WO 96 21 867 (1996-07-01), None
patent: WO 02 067 005 (2002-08-01), None
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