Method of removing the effects of electrical shorts and shunts c

Details Method of removing the effects of electrical shorts and shunts c Method of removing the effects of electrical shorts and shunts c

1978-07-19

1979-09-04

Weisstuch, Aaron

Batteries: thermoelectric and photoelectric

Thermoelectric

Radiation pyrometer

136 89TF, 357 2, 357 30, H01L 3104

Patent

active

041669185

ABSTRACT:
A method of removing the effects of electrical shorts and shunts created during the fabrication process and improving the performance of a solar cell with a thick film cermet electrode opposite to the incident surface by applying a reverse bias voltage of sufficient magnitude to burn out the electrical shorts and shunts but less than the break down voltage of the solar cell.

REFERENCES:
patent: 3436275 (1969-04-01), Tsao et al.
patent: 3597281 (1971-08-01), Webb et al.
patent: 3630627 (1971-12-01), Low et al.
patent: 3843420 (1974-10-01), Gittleman et al.
patent: 3919589 (1975-11-01), Hanak
patent: 4064521 (1977-12-01), Carlson
patent: 4071426 (1978-01-01), Pinch et al.
patent: 4127424 (1978-11-01), Ullery, Jr.
J. J. Hanak et al., "Calculation of Composition of Dilute Cosputtered Multicomponent Films", J. Appl. Phys., vol. 44, pp. 5142-5147 (1973).
C. R. Wronski et al., "Granular Metal-Semiconductor Schottky Barriers", J. Appl. Phys., vol. 45, pp. 295-299 (1974).
C. R. Wronski, "Electronic Properties of Amorphous Silicon in Solar Cell Operation", IEEE Trans. Electron Devices, vol. ED-24, pp. 351-357 (1977).
J. J. Hanak et al., "Calculation of Deposition Profiles & Compositional Analysis of Cosputtered Films", J. Appl. Phys., vol. 43, pp. 1666-1673 (1972).
D. E. Carlson, "Amorphous Silicon Solar Cells", IEEE Trans. Electron Devices, vol. ED-24, pp. 449-453 (1977).
J. J. Hanak, "The Multiple-Sample Concept in Materials Research", J. Materials Sci., vol. 5, pp. 964-971 (1970).

Affiliated with

Also associated with

Rating

Method of removing the effects of electrical shorts and shunts c does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of removing the effects of electrical shorts and shunts c, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of removing the effects of electrical shorts and shunts c will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2129033