Method of reforming a tip portion of a probe

Details Method of reforming a tip portion of a probe Method of reforming a tip portion of a probe

1998-03-09

2000-01-11

Gorgos, Kathryn

Electrolysis: processes, compositions used therein, and methods

Electrolytic coating

Treating electrolytic or nonelectrolytic coating after it is...

205149, 205228, C25D 550

Patent

active

060131691

ABSTRACT:
A method of reforming a tungsten probe tip includes forming a non-oxidizing metallic film on the surface of the tungsten probe tip, heating the film in a non-oxidizing atmosphere or vacuum, and diffusing the film into the tungsten probe tip. The non-oxidizing metallic film can be formed from a metal such as gold, platinum, rhodium, palladium, and iridium. The reformed tungsten probe tip can be used in low voltage and low current testing, and has excellent abrasion resistance, conductivity and oxidation resistance.

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