Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-09-26
2010-12-07
Ishrat, Sherali (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
07848562
ABSTRACT:
The time required to perform a passive voltage contrast test of an area of interest of a layer of interest is substantially reduced by digitizing a passive voltage contrast image to form contrast data that represents the image, and comparing the contrast data to computer aided design (CAD) data that defines the semiconductor device.
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patent: 2010/0070942 (2010-03-01), Madurawe
Bhimavarapu Usharani
Gemmill Zachary Joshua
Jacobson Steven
Ng William
Nguyen Duc huu
Ishrat Sherali
National Semiconductor Corporation
Pickering Mark C.
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