Method of reducing ESD damage in thin film read heads which...

Details Method of reducing ESD damage in thin film read heads which... Method of reducing ESD damage in thin film read heads which...

2005-09-20

2005-09-20

Tugbang, A. Dexter (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S603070, C029S603110, C029S603130, C029S603140, C029S605000, C029S606000, C029S609000, C324S309000, C324S314000, C324S318000, C324S322000, C324S525000, C324S526000, C324S528000, C360S313000, C360S319000, C360S321000, C360S322000, C360S323000, C360S324000, C427S127000, C427S128000, C451S005000, C451S041000

Reexamination Certificate

active

06944937

ABSTRACT:
The present invention provides a method of manufacturing a magnetoresistive read head which reduces electrostatic discharge and allows measurement of gap resistances in the head.

REFERENCES:
patent: 5208535 (1993-05-01), Nakayama et al.
patent: 6221559 (2001-04-01), Lee et al.
patent: 6246553 (2001-06-01), Biskeborn
patent: 6570391 (2003-05-01), Liang Lim et al.
patent: 08061955 (1996-03-01), None
“Study of magnetic tunnel junction read sensors” Ho, M.K.; Tsang, C.H.; Fontana, R.E., Jr.; Parkin, S.S.; Carey, K.J.; Tao Pan; MacDonald, S.; Arnett, P.C.; Moore, J.O.; IEEE Transactions on , vol. : 37 , issue:4 , Jul. 2001 pp.: 1691-1694.

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