Method of recognizing layout and subdivision patterns of radiati

Details Method of recognizing layout and subdivision patterns of radiati Method of recognizing layout and subdivision patterns of radiati

1989-02-17

1990-10-09

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 6, 382 22, G06K 920

Patent

active

049625390

ABSTRACT:
A method for recognizing the layout pattern of radiation images comprises the steps of preparing two-valued masks, each composed of a two-valued signal representing a layout pattern for radiation images which are to be stored on a stimulable phosphor sheet, and obtaining a preliminary read-out image signal by carrying out preliminary read out on a stimulable phosphor sheet on which radiation images have been stored. The layout pattern of the radiation images is recognized by converting the preliminary read-out image signal into a two-valued image signal, calculating rating values, which represent the degree of pattern matching between the two-valued image signal and the two-valued masks, finding the highest rating value that represents the highest degree of pattern matching among the rating values, and comparing the highest rating value with a predetermined value representing a predetermined degree of pattern matching.

REFERENCES:
patent: 4238780 (1980-12-01), Doemens
patent: 4903310 (1990-02-01), Takeo et al.
patent: 4903311 (1990-02-01), Nakamura

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