Method of reading multi-level NAND flash memory cell and...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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C365S185120

Reexamination Certificate

active

11008486

ABSTRACT:
The disclosed is a method of reading a multi-level NAND flash memory cell and a circuit for the same. The read circuit for the NAND flash memory device includes a NAND flash memory cell having multi-level information, a first page buffer for storing an upper-bit, a second page buffer for storing a lower bit, and pass transistor for changing information of the second page buffer according to a variation of the first page buffer. In accordance with the present invention, “00” or “01” information is read out by applying a first voltage to a word line of the cell. “00”, “01”, or “11” information is read out by applying a second voltage to the word line. A latch pass control signal is applied to a pass transistor. Thus, it is possible to read out “00”, “01”, “11”, or “10” information.

REFERENCES:
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patent: 6373748 (2002-04-01), Ikehashi et al.
patent: 6671204 (2003-12-01), Im
patent: 6813214 (2004-11-01), Cho et al.
patent: 6963502 (2005-11-01), Park
patent: 6996014 (2006-02-01), Lee et al.
patent: 100172408 (1998-10-01), None

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