Method of quantifying the topographic structure of a surface

Details Method of quantifying the topographic structure of a surface Method of quantifying the topographic structure of a surface

1992-06-24

1994-04-26

Teska, Kevin J.

Boots, shoes, and leggings

364560, 364578, 356379, 33546, G01B 2120, G01B 2130

Patent

active

053072928

ABSTRACT:
A fractal-based or "patchwork" method for analyzing topographic data simulates covering the surface of a specimen surface with triangular patches in order to determine the relative surface area which is a function of patch size or scale of observation or interaction. The specimen surface has X and Y horizontal axes and a vertical Z axis. Height data is obtained for each point of a grid network of points on the surface, the points being arranged in parallel rows and the rows being spaced. The specimen surface is defined with triangles having a surface area equal to a preselected patch area value. The total area of the planar triangles is calculated to obtain a total measured area of value. The area of the specimen surface in the X-Y plane that is defined by the triangles is calculated to obtain a total measured area value. The total measured area value is divided by the total projected area value to obtain a relative area value. The relative values for several patch area values are plotted to obtain a slope and a threshold, or crossover, point. The threshold is indicative of a point which separates the relatively large scales of observation or interaction which are best described by Euclidean geometry from those smaller ones which are best described by fractal geometry.

REFERENCES:
patent: 4912664 (1990-03-01), Weiss et al.
patent: 5189626 (1993-02-01), Colburn
S. Peleg, et al. IEEE Trans on Pattern Analysis and Machine Intelligence-1984-pp. 518-523.
B. B. Mandelbrot-Fractals in Physics-1986-pp. 17-20.
J. W. Martin & D. P. Bentz-Fractal-Based Description of the Roughness of Blasted Steel Panels-1987-pp. 35-41.

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