Method of providing non-intrusive optical test access without op

Details Method of providing non-intrusive optical test access without op Method of providing non-intrusive optical test access without op

1996-05-15

1998-03-17

Negash, Kinfe-Michael

Optical: systems and elements

Deflection using a moving element

Using a periodically moving element

356 731, H04B 1008

Patent

active

057293686

ABSTRACT:
A non-intrusive test method for monitoring the performance of an optical communications system generates a parallel electrical signal corresponding to a transmitted or received optical signal without the use of a signal attenuating beam splitter or other device having optical loss by deriving the parallel electrical signal from a modulated electrical signal associated with the generation or detection of the optical signal, or from stray light generated by the optical light source. An ATM module containing a plurality of transmit and receive cables connects selected parallel electrical signals corresponding to selected optical cables to a limited number of test jacks employing a multiplexer which may be computer controlled. The non-intrusive test method allows maximal optical cable range.

REFERENCES:
patent: 5218465 (1993-06-01), Lebby et al.
patent: 5552881 (1996-09-01), Jezwinski et al.

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