Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1988-03-07
1989-08-08
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, 371 20, 371 25, G01R 3100, G01R 3128
Patent
active
048556700
ABSTRACT:
An electronic circuit is tested by applying a sequence of test vectors to the input port of the circuit as a plurality of sub-sequences each including at least one test vector. Serial scan vectors provided at a serial scan port of the circuit are examined after each sub-sequence, and determination is made as to whether a part of the serial scan vector indicates the presence of a defect in the circuit. In the event that a part of the serial scan vector indicates the presence of a defect in the circuit, information that identifies the number of serial scan vectors that have previously been examined and the part of the serial scan vector that indicates the presence of a defect in the circuit is made available for analysis.
REFERENCES:
patent: 3761695 (1973-09-01), Eichelberger
patent: 4369511 (1983-01-01), Kimura et al.
patent: 4503536 (1985-03-01), Panzer
patent: 4534028 (1985-08-01), Trischler
patent: 4571724 (1986-02-01), Belmondo et al.
patent: 4631724 (1986-12-01), Shimizu
patent: 4728883 (1988-03-01), Green
Sugamori et al.; "Analysis and Definition of Overall Timing Accuracy in VLSI Test System"; 1981 IEEE Test Conference; pp. 143-153.
Eisenzopf Reinhard J.
Hulse Robert S.
Nguyen Vinh P.
Smith-Hill John
Tektronix Inc.
LandOfFree
Method of providing information useful in identifying defects in does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of providing information useful in identifying defects in, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of providing information useful in identifying defects in will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-908245