Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2007-07-25
2010-12-21
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S737000, C438S706000, C257SE21215
Reexamination Certificate
active
07855152
ABSTRACT:
The invention provides a production method for an active matrix substrate in which a plurality of contact holes are formed by a one-mask process so as to reach metal films which are present at different depth positions in an insulating layer and are not evaporated by dry etching using a fluorine-containing gas. The method includes a step of performing dry etching using mixed gas of CHF3, CF4and O2to form the plurality of contact hole, a step of subjecting the plurality of contact holes to oxygen ashing, and a step of forming a transparent conductive film in the plurality of contact holes.
REFERENCES:
patent: 5882996 (1999-03-01), Dai
patent: 6271084 (2001-08-01), Tu et al.
patent: 2002/0140895 (2002-10-01), Kimura et al.
patent: 2002/0142610 (2002-10-01), Chien et al.
patent: 7-37866 (1995-02-01), None
patent: 2001-102362 (2001-04-01), None
patent: 2001-308182 (2001-11-01), None
patent: WO 00/39845 (2000-07-01), None
“Dictionary of Physics” 2004, Macmillan Publishers, p. 819.
Doi Satoshi
Yanase Kiyoshi
NEC LCD Technologies Ltd.
Smith Bradley K
Sughrue & Mion, PLLC
LandOfFree
Method of producing active matrix substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of producing active matrix substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing active matrix substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4199334