Method of producing a thin layer of semiconductor material

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies

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438455, 438459, H01L 2130, H01L 2146

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active

060202521

ABSTRACT:
A thin layer of semiconductor material is produced by implanting ions through a flat face of a semiconductor wafer in order to create a layer of microcavities, the ion dose being within a specific range in order to avoid the formation of blisters on the flat face. The resulting wafer is then subjected to a thermal treatment step in order to achieve coalescence of the microcavities. During or following the thermal treatment, a thin layer is separated from the rest of the wafer by application of mechanical force.

REFERENCES:
patent: 5374564 (1994-12-01), Bruel
patent: 5413951 (1995-05-01), Ohori et al.
patent: 5524339 (1996-06-01), Gorowitz et al.
patent: 5559043 (1996-09-01), Bruel
patent: 5567654 (1996-10-01), Beilstein, Jr. et al.
patent: 5618739 (1997-04-01), Takahashi et al.
patent: 5622896 (1997-04-01), Knotter et al.
"Silicon on insulator Material Technology" Bruel Electronics Letters; 31 (1995) Jul. 6; No. 14; pp. 1201-1202.
"Investigtion of the bubble formation mechnanism in a-Si:H films by Fourier-transform infrared microspectroscopy" Mishima et al Japan Applied Physics; 64(8); Oct. 15, 1988; pp. 3972-3974.

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